Test Adaptors

Test Adaptors

Diagnosys Device Test Interface: Robust and reliable electrical contact for in-circuit and out-of-circuit test of ICs

A critical requirement for testing a component in-circuit is to ensure good electrical contact with the pins of the device being tested. Although there are many commercially available test clips, they are often fragile and limited to the more common device package types.

Diagnosys has designed and developed an extensive range of robust and reliable DTIs (Device Test Interfaces) for in-circuit test of ICs in a test environment. This range includes DTIs for fine pitch devices, through-hole devices and underside probing. In addition to this standard range, custom DTIs can be provided to accommodate the many varied and diverse package designs you may encounter.

The Diagnosys DTI range is purposely designed for use in demanding test environments. They provide the physical electrical interface between the pin electronics of the test system and the device being tested. These interfaces are constructed from a special material that is precision milled and drilled, delivering a hardwearing finish that will provide years of use.

The out-of-circuit test adaptors are designed to work with the PinPoint range of test systems. They are robust and flexible units allowing you to program, test, identify and compare devices.

By removing any effects and interference from other components in a circuit you can rapidly develop test routines, execute tests, identify unknown device types and perform live data comparison between devices (not PGA).

The adaptors can also be used to detect counterfeit devices.

The P2-500-SOIC is a universal adaptor for testing SOICs (Small Outline Integrated Circuits) out-of-circuits. Designed for use with the PinPoint range of test systems and the P2-500-DIL test box, the adaptor allows you to verify the functionality of SOIC devices or to develop new test routines without interference from associated circuitry when they are fitted in a circuit.

The SOIC Test adaptor uses a 44-pin Universal SOIC Test Socket and can therefore accommodate any SOIC device (both wide and narrow bodies) from 8 pins up to 44 pins, which is the largest SOIC device body available on the market.

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